A decision diagram based hierarchical test pattern generator

statement of authorship
G.Jervan, A.Markus, J.Raik, R.Ubar
location of publication
[Tallinn]
year of publication
pages
p. 159-162: ill
ISBN
9985-59-081-3
notes
Bibl. 5 ref
Jervan, G., Markus, A., Raik, J., Ubar, R. A decision diagram based hierarchical test pattern generator // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 159-162: ill.