Jervan, G., Markus, A., Raik, J., Ubar, R.

A decision diagram based hierarchical test pattern generator

author

Jervan, Gert

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

G.Jervan, A.Markus, J.Raik, R.Ubar

source

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1998

pages

p. 159-162: ill

ISBN

9985-59-081-3

notes

Bibl. 5 ref

Jervan, G., Markus, A., Raik, J., Ubar, R. A decision diagram based hierarchical test pattern generator // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 159-162: ill.