Multiple stuck-at-fault detection theorem
author
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
source
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
location of publication
Tallinn
publisher
IEEE
year of publication
2012
pages
p. 236-241 : ill
conference name, date
IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), April 18-20, 2012
conference location
Tallinn
subject term
rikked
testimine
diagnostika (tehnika)
keyword
combinational circuits
multiple faults
fault masking
ISBN
978-1-4673-1185-4
notes
Bibliogr.: 24 ref
language
inglise