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1
book article
High-level modeling and testing of multiple control faults in digital systems
Jasnetski, Artjom
;
Oyeniran, Adeboye Stephen
;
Tšertov, Anton
;
Schölzel, Mario
;
Ubar, Raimund-Johannes
Formal proceedings of the 2016 IEEE 19th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 20-22, 2016, Košice, Slovakia
2016
/
[6] p. : ill
http://dx.doi.org/10.1109/DDECS.2016.7482445
book article
2
book article
How to prove that a circuit is fault-free?
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings : 15th Euromicro Conference on Digital System Design DSD 2012 : 5-8 September 2012, Cesme, Izmir, Turkey
2012
/
p. 427-430 : ill
https://www.researchgate.net/publication/262271409_How_to_Prove_that_a_Circuit_is_Fault-Free
book article
3
book article
Multiple fault testing in systems-on-chip with high-level decision diagrams
Ubar, Raimund-Johannes
;
Oyeniran, Adeboye Stephen
;
Schölzel, Mario
;
Vierhaus, Heinrich Theodor
Proceedings of 2015 10th International Design & Test Symposium (IDT) : Dead Sea, Jordan, 14-16 December 2015
2015
/
p. 66-71 : ill
http://dx.doi.org/10.1109/IDT.2015.7396738
book article
4
book article
Multiple stuck-at-fault detection theorem
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
Proceedings of the 2012 IEEE 15th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS) : April 18-20, 2012 Tallinn, Estonia
2012
/
p. 236-241 : ill
book article
5
book article
Representing gate-level SET faults by multiple SEU faults on RT-level
Bagbaba, Ahmet Cagri
;
Jenihhin, Maksim
;
Ubar, Raimund-Johannes
;
Sauer, Christian
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
2020
/
art. 19889351, 6 p. : ill
https://doi.org/10.1109/IOLTS50870.2020.9159715
book article
Seotud publikatsioonid
1
Methods to optimize functional safety assessment for automotive integrated circuits = Meetodid autotööstuse kiipide funktsionaalse ohutuse hindamise optimeerimiseks
6
book article
Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]
Ubar, Raimund-Johannes
;
Kostin, Sergei
;
Raik, Jaan
2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE
2013
/
p. 36-41 : ill [CD-ROM]
book article
Number of records 6, displaying
1 - 6
keyword
58
1.
multiple faults
2.
multiple-input multiple output system
3.
broken rotor bar faults
4.
circuit faults
5.
classification of faults
6.
control faults
7.
faults
8.
faults in power system
9.
hard-to-detect faults
10.
high-level control faults
11.
indefinite faults
12.
inter-disk and inter-turn faults
13.
localization of faults
14.
motor faults
15.
non-robust and functional sensitization of delay faults
16.
power distribution faults
17.
power system faults
18.
rotor faults
19.
Safe Faults
20.
Single Stuck-at Faults
21.
stuck-at-faults
22.
tectonic faults
23.
terms-transient faults
24.
transient faults
25.
transition delay faults
26.
unknown faults
27.
untestable faults
28.
carrier sense multiple access/collision avoidance (CSMA/CA)
29.
consistency in multiple microplastic datasets
30.
multiple
31.
multiple active bridge
32.
multiple case study
33.
Multiple cases study
34.
Multiple criteria analysis
35.
multiple criteria approach
36.
multiple criteria assessment
37.
multiple criteria decision making
38.
multiple criteria modeling
39.
multiple headspace extraction
40.
multiple inheritance
41.
Multiple Linear Regression
42.
multiple melting events
43.
multiple regression models
44.
multiple scales
45.
multiple scattering
46.
multiple sclerosis
47.
multiple source localization
48.
multiple streams framework
49.
multiple stressor effect sizes
50.
multiple stressor effect types
51.
multiple stressors
52.
Non Orthogonal Multiple Access (NOMA)
53.
nonorthogonal multiple access (NOMA)
54.
Non-Orthogonal Multiple Access (NOMA)
55.
Orthogonal Multiple Access (OMA)
56.
secondary progressive multiple sclerosis
57.
SSBDDs with multiple inputs
58.
time division multiple access (TDMA)
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