Test time minimization for hybrid BIST with test pattern broadcasting
author
Ubar, Raimund-Johannes
Jenihhin, Maksim
Jervan, Gert
Peng, Zebo
statement of authorship
Raimund Ubar, Maksim Jenihhin, Gert Jervan, Zebo Peng
source
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
location of publication
[S. l.]
year of publication
2003
pages
p. 112-116 : ill
ISBN
87-982637-5-7
notes
Bibliogr.: 11 ref