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Peng, Zebo (author)
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1
book article
Analysis of a test method for delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
;
Peng, Zebo
Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006
2006
/
p. 42-46 : ill
book article
2
book article
Challenges for future system-on-chip design
Hollstein, Thomas
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Glesner, Manfred
Circuit Paradigm in the 21st Century : ECCTD '01 : proceedings of the 15th European Conference on Circuit Theory and Design : Helsinki University of Technology, Finland, 28th-31st August 2001. Vol 3
2001
/
p. 173-176
book article
3
book article
Energy minimization for hybrid BIST in a system-on-chip test environment
Ubar, Raimund-Johannes
;
Shchenova, Tatjana
;
Jervan, Gert
;
Peng, Zebo
European Test Symposium : ETS 2005 : 22-25 May 2005, Tallinn, Estonia : proceedings
2005
/
p. 2-7 : ill
book article
4
book article
Fast test cost calculation for hybrid BIST in digital systems
Orasson, Elmet
;
Raidma, Rein
;
Ubar, Raimund-Johannes
;
Jervan, Gert
;
Peng, Zebo
Euromicro Symposium on Digital Systems Design : [Architectures, Methods and Tools : DSD 2001] : September 4-6, 2001, Warsaw, Poland : proceedings
2001
/
p. 318-325 : ill
https://www.semanticscholar.org/paper/Fast-test-cost-calculation-for-hybrid-BIST-in-Orasson-Raidma/5aafcda5a18c2aabf0ad20cac10af10727f3c58f
book article
5
book article
High-level test synthesis with hierarchical test generation
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Raik, Jaan
;
Ubar, Raimund-Johannes
17th NORCHIP Conference : Oslo, Norway, 8-9 November 1999 : proceedings
1999
/
p. 291-296
book article
6
book article
A hybrid BIST architecture and its optimization for SoC testing
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Kruus, Helena
Proceedings of the 3rd International Symposium on Quality Electronic Design : ISQED 2002, March 18-21, 2002, San Jose, California
2002
/
p. 273-279 : ill
book article
7
journal article
Hybrid BIST energy minimisation technique for system-on-chip testing
Jervan, Gert
;
Peng, Zebo
;
Shchenova, Tatjana
;
Ubar, Raimund-Johannes
IEE proceedings computers & digital techniques
2006
/
4, p. 208-216 : ill
https://citeseerx.ist.psu.edu/document?repid=rep1&type=pdf&doi=5ae755d323ccba87f8ff886334e3dd6d33560874
journal article
8
journal article
Hybrid BIST methodology for testing core-based systems
Jervan, Gert
;
Ubar, Raimund-Johannes
;
Peng, Zebo
Proceedings of the Estonian Academy of Sciences. Engineering
2006
/
3-2, p. 300-322 : ill
journal article
9
book article
Hybrid BIST optimization for core-based systems with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
DELTA 2004 : second IEEE International Workshop on Electronic Design, Test and Applications : 28-30 January 2004, Perth, Australia : proceedings
2004
/
p. 3-8 : ill
http://doi.ieeecomputersociety.org/10.1109/DELTA.2004.10057
book article
10
book article
Hybrid BIST time minimization for core-based systems with STUMPS architecture
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
18th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 3-5 November 2003, Boston, Massachusetts : proceedings
2003
/
p. 225-232 : ill
https://ieeexplore.ieee.org/document/1250116
book article
11
book article
An improved estimation methodology for hybrid BIST cost calculation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
Proceedings [of] 22nd NORCHIP Conference : Oslo, Norway, 8-9 November 2004
2004
/
p. 297-300 : ill
book article
12
book article
An improved estimation technique for hybrid BIST test set generation
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Korelina, Olga
DDECS : 8th IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems : April 13-16, 2005, Sopron, Hungary : proceedings
2005
/
p. 182-185 : ill
book article
13
book article
Off-line testing of delay faults in NoC interconnects
Bengtsson, Tomas
;
Jutman, Artur
;
Kumar, Shashi
;
Peng, Zebo
;
Ubar, Raimund-Johannes
9th EUROMICRO Conference on Digital Systems Design : Architectures, Methods and Tools (DSD 2006) : 30 August 2006-1 September 2006, Cavtat near Dubrovnik, Croatia : proceedings
2006
/
p. 677-680 : ill
http://dx.doi.org/10.1109/DSD.2006.72
book article
14
book article
Power-constrained hybrid BIST test scheduling in an abort-on-first-fail test environment
He, Zhiyuan
;
Jervan, Gert
;
Peng, Zebo
;
Eles, Petru
Proceedings : DSD'2005 : 8th Euromicro Conference on Digital System Design : Architectures, Methods and Tools : Porto, Portugal, August 30 - September 3, 2005
2005
/
p. 83-86 : ill
book article
15
book article
Test cost minimization for hybrid BIST
Jervan, Gert
;
Peng, Zebo
;
Ubar, Raimund-Johannes
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
2000
/
p. 283-298 : ill
https://ieeexplore.ieee.org/abstract/document/887168
book article
16
journal article
Test methods for crosstalk-induced delay and glitch faults in network-on-chip interconnects implementing asynchronous communication protocols
Bengtsson, Tomas
;
Kumar, Shashi
;
Ubar, Raimund-Johannes
;
Jutman, Artur
;
Peng, Zebo
IET computers and digital techniques
2008
/
6, p. 445-460
journal article
17
journal article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
Journal of computer science and technology
2006
/
6, p. 907-912 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
journal article
18
book article
Test time minimization for hybrid BIST of core-based systems
Jervan, Gert
;
Eles, Petru
;
Peng, Zebo
;
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
12th Asian Test Symposium (ATS 2003) : 17-19 November 2003, Xian, China
2003
/
p. 318-325 : ill
https://link.springer.com/article/10.1007/s11390-006-0907-x
book article
19
book article
Test time minimization for hybrid BIST with test pattern broadcasting
Ubar, Raimund-Johannes
;
Jenihhin, Maksim
;
Jervan, Gert
;
Peng, Zebo
IEEE NORCHIP 2003 : 21 Norchip Conference : Riga, Latvia, 10-11 November 2003 : proceedings
2003
/
p. 112-116 : ill
https://www.ida.liu.se/labs/eslab/publications/pap/db/norchip03.pdf
book article
Number of records 19, displaying
1 - 19
author
11
1.
Peng, Zebo
2.
Chen, Peng
3.
Cheng, Peng
4.
Peng, Chengxiang
5.
Peng, Cong
6.
Peng, Fang Zheng
7.
Peng, Z.
8.
Peng, Zhang
9.
Peng, Yahuan
10.
Tang, Peng
11.
Wang, Peng
CV
1
1.
Peng, Chengxiang
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