Ivask, E., Ubar, R.-J., Raik, J., Schneider, A.

Internet based test generation and fault simulation

author

Ivask, Eero

Ubar, Raimund-Johannes

Raik, Jaan

Schneider, Andre

statement of authorship

E.Ivask, R.Ubar, J.Raik, A.Schneider

source

IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001

location of publication

[S. l.]

year of publication

2001

pages

p. 57-60 : ill

ISBN

963 7175 16 4

notes

Bibliogr.: 7 ref

Ivask, E., Ubar, R.-J., Raik, J., Schneider, A. Internet based test generation and fault simulation // IEEE Design and Diagnostics of Electronic Circuits and Systems - IEEE DDECS 2001 : Fourth International Workshop on IEEE Design and Diagnostics of Electronic Circuits and Systems : Györ, Hungary, April 18-20, 2001. [S. l.], 2001. p. 57-60 : ill.