Raik, J., Jutman, A., Ubar, R.-J. - TalTech Research Portal

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Exact static compaction of independent test sequences

author

Raik, Jaan

Jutman, Artur

Ubar, Raimund-Johannes

statement of authorship

J.Raik, A.Jutman, R.Ubar

source

BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia

location of publication

Tallinn

publisher

[Tallinn Technical University]

year of publication

2002

pages

p. 315-318 : ill

ISBN

9985-59-292-1

notes

Bibliogr.: 13 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

elektriahelad

testid

testimine

algoritmid

Raik, J., Jutman, A., Ubar, R.-J. Exact static compaction of independent test sequences // BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia. Tallinn : [Tallinn Technical University], 2002. p. 315-318 : ill.