IEEE European Test Symposium (ETS)
author
Eggersgluss, Stephan
Hamdioui, Said
Jutman, Artur
Michael, Maria K.
Raik, Jaan
statement of authorship
Stephan Eggersglüß, Said Hamdioui, Artur Jutman, Maria K. Michael, Jaan Raik, Matteo Sonza Reorda, Mehdi Tahoori, Elena-IoanaVatajelu
source
2019 IEEE International Test Conference (ITC)
location of publication
[S.l.]
publisher
IEEE
year of publication
2019
pages
4 p
conference name, date
2019 IEEE International Test Conference (ITC)
conference location
Washington, DC, USA
url
https://doi.org/10.1109/ITC44170.2019.9000148
subject term
elektroonika
testimine
töökindlus
konverentsid
Scopus
https://www.scopus.com/sourceid/25589
https://www.scopus.com/record/display.uri?eid=2-s2.0-85081583727&origin=inward&txGid=3cc96819b9a7387458a3ba31812d2556
WOS
https://www.webofscience.com/wos/woscc/full-record/WOS:000540385000037
quartile
Q1
category (general)
Mathematics
Matemaatika
Engineering
Tehnika
category (sub)
Mathematics. Applied mathematics
Matemaatika. Rakendusmatemaatika
Engineering. Electrical and electronic engineering
Tehnika. Elektri- ja elektroonikatehnika
name of the institution
European Test Symposium (ETS)
subject of location
Euroopa
ISSN
2378-2250
1089-3539
ISBN
978-1-7281-4823-6
Open Access
Open Access
scientific publication
teaduspublikatsioon
classifier
3.1
TalTech department
arvutisüsteemide instituut
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems