Hierarchical identification of untestable faults in sequential circuits
author
Raik, Jaan
Ubar, Raimund-Johannes
Krivenko, Anna
Kruus, Margus
statement of authorship
Jaan Raik, Raimund Ubar, Anna Krivenko, Margus Kruus
source
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, DSD 2007 : 29-31 August 2007, Lübeck, Germany : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
2007
pages
p. 668-671 : ill
conference name, date
10th Euromicro Conference on Digital System Design Architectures, Methods and Tools, 29-31 August, 2007
conference location
Lübeck, Germany
url
http://dx.doi.org/10.1109/DSD.2007.4341539
subject term
elektronlülitused
rikked
testimine
ISBN
978-0-7695-2978-3
notes
Bibliogr.: 8 ref
TTÜ department
arvutitehnika instituut
language
inglise