Automated correction of design errors by edge redirection on high-level decision diagrams
author
Karputkin, Anton
Ubar, Raimund-Johannes
Tombak, Mati
Raik, Jaan
statement of authorship
Anton Karputkin, Raimund Ubar, Mati Tombak, Jaan Raik
source
13th International Symposium on Quality Electronic Design (ISQED), 2012
location of publication
[S.l.]
publisher
IEEE
year of publication
2012
pages
p. 686-693 : ill
conference name, date
13th International Symposium on Quality Electronic Design (ISQED), March 19-21, 2012
conference location
Santa Clara, CA, USA
url
https://ieeexplore.ieee.org/document/6113980
subject term
digitaaltehnika
keerukusteooria
testimine
generaatorid
nanoelektroonika
otsustusdiagrammid
ISSN
1948-3287
ISBN
978-1-4673-1034-5
notes
Bibliogr.: 18 ref
language
inglise