Multiple fault analyses in logic circuits
author
Ubar, Raimund-Johannes
statement of authorship
Ubar, R.
source
IFAC-Symposium Discrete Systems : Dresden, 14.-19. 3. 77
location of publication
Dresden
publisher
s.n.
year of publication
1977
pages
p. [?]
conference name, date
IFAC-Symposium Discrete Systems, March 14-19, 1977
conference location
Dresden
subject term
elektronlülitused
vead
testimine
TTÜ department
elektronarvutite kateeder
language
saksa