Built-in self diagnosis with multiple signature analyzers in digital systems
author
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
statement of authorship
Raimund Ubar, Sergei Kostin, Jaan Raik
source
Proceedings of the 9th IEEE Latin-American Test Workshop : LATW2008 : February 17-20, 2008, Puebla, Mexico
location of publication
[S.l.]
year of publication
2008
pages
p. 29-34 : ill
notes
Bibliogr.: 16 ref