Hierarchical test generation with multi-level decision diagram models
author
Jervan, Gert
Markus, Antti
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Gert Jervan, Antti Markus, Jaan Raik, Raimund Ubar
source
Proceedings of the 7th IEEE North Atlantic Test Workshop, West Greenwich RI, USA, May 28-29, 1998
location of publication
[S.l.]
year of publication
1998
pages
p. 26-33
language
inglise