Application of sequential test set compaction to LFSR reseeding
statement of authorship
Igor Aleksejev, Artur Jutman, Jaan Raik, Raimund Ubar
location of publication
[S.l.]
publisher
year of publication
pages
p. 102-107 : ill
conference name, date
26th Norchip Conference, 17-18 November, 2008
conference location
Tallinn, Estonia
ISBN
978-1-4244-2492-4
notes
Bibliogr.: 11 ref
TTÜ department
language
inglise
subject term
Aleksejev, I., Jutman, A., Raik, J., Ubar, R. Application of sequential test set compaction to LFSR reseeding // 26th Norchip Conference : Tallinn, Estonia, 17-18 November 2008 : formal proceedings. [S.l.] : IEEE, 2008. p. 102-107 : ill.