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Hierarchical test generation for combinational circuits with real defects coverage

author
Cibakova, Tatiana
Fischerova, Maria
Gramatova, Elena
Kuzmicz, W.
Pleskacz, Witold A.
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
T.Cibakova, M.Fischerova, E.Gramatova, W.Kuzmicz, W.A.Pleskacz, J.Raik, R.Ubar
source
Microelectronics reliability
publisher
Elsevier
journal volume number month
vol. 42, 7
year of publication
2002
pages
p. 1141-1149 : ill
url
https://www.sciencedirect.com/science/article/pii/S002627140200080X
subject term
elektriahelad
testimine
defektid
ISSN
0026-2714
notes
Bibliogr.: 25 ref
TalTech department
arvutisüsteemide instituut
language
inglise
Cibakova, T., Fischerova, M., Gramatova, E., Kuzmicz, W., Pleskacz, W.A., Raik, J., Ubar, R.-J.* Hierarchical test generation for combinational circuits with real defects coverage // Microelectronics reliability (2002) vol. 42, 7, p. 1141-1149 : ill. https://www.sciencedirect.com/science/article/pii/S002627140200080X