Constraint-based test pattern generation at the register-transfer level
statement of authorship
Taavi Viilukas, Jaan Raik, Maksim Jenihhin, Raimund Ubar, Anna Krivenko
source
Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria
location of publication
[S.l.]
publisher
year of publication
pages
p. 352-357 : ill
conference name, date
13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010
conference location
Vienna, Austria
subject term
ISBN
978-1-4244-6610-8
notes
Bibliogr.: 21 ref
language
inglise
Viilukas, T., Raik, J., Jenihhin, M., Ubar, R., Krivenko, A. Constraint-based test pattern generation at the register-transfer level // Proceedings of the 13th IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems : April 14-16, 2010, Vienna, Austria. [S.l.] : IEEE, 2010. p. 352-357 : ill.