Brik, M., Jervan, G., Markus, A., Raik, J., Ubar, R.

A hierarchical automatic test pattern generator based on using alternative graphs

author

Brik, Marina

Jervan, Gert

Markus, Antti

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

M. Brik, G. Jervan, A. Markus, J. Raik, R. Ubar

source

Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997

location of publication

[S.l.]

year of publication

1997

pages

p. 415-420

language

inglise

Brik, M., Jervan, G., Markus, A., Raik, J., Ubar, R. A hierarchical automatic test pattern generator based on using alternative graphs // Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997. [S.l.], 1997. p. 415-420.