A hierarchical automatic test pattern generator based on using alternative graphs
statement of authorship
M. Brik, G. Jervan, A. Markus, J. Raik, R. Ubar
location of publication
[S.l.]
year of publication
pages
p. 415-420
language
inglise
subject term
Brik, M., Jervan, G., Markus, A., Raik, J., Ubar, R. A hierarchical automatic test pattern generator based on using alternative graphs // Proceedings of the 4th International Workshop Mixed Design of Integrated Circuits and Systems : MIXDES'97 : Poznan, Poland, 12-14 June 1997. [S.l.], 1997. p. 415-420.