Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
statement of authorship
Daniel Kropman, Tiit Kärner, Sergei Dolgov, Ivo Heinmaa, Tõnu Laas, and Charalampos A. Londos
source
journal volume number month
Vol. 8, 3
year of publication
pages
p. 694-696 : ill
ISSN
1610-1642
notes
Bibliogr.: 6 ref
language
inglise
subject term
keyword
Kropman, D., Kärner, T., Dolgov, S., Heinmaa, I., Laas, T., Londos, C.A. Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties // Physica status solidi (c) (2011) Vol. 8, 3, p. 694-696 : ill.