Test cost minimization for hybrid BIST
author
Jervan, Gert
Peng, Zebo
Ubar, Raimund-Johannes
statement of authorship
Gert Jervan, Zebo Peng, Raimund Ubar
source
IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems : 25-27 October 2000, Yamanashi, Japan : proceedings
location of publication
Los Alamitos, CA
publisher
IEEE Computer Society
year of publication
2000
pages
p. 283-298 : ill
ISBN
0-7695-0719-0
notes
Bibliogr.: 8 ref