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On BTI aging rejuvenation in memory address decoders

author
statement of authorship
Gürsoy, Cemil Cem; Kraak, Daniel; Ahmed, Foisal; Taouil, Mottaqiallah; Jenihhin, Maksim; Hamdioui, Said
source
2022 IEEE 23rd Latin American Test Symposium, LATS 2022
location of publication
Piscataway, NJ
publisher
year of publication
pages
Code 184360
conference name, date
23rd IEEE Latin American Test Symposium, LATS 2022
conference location
Montevideo, Uruguay
url
ISBN
978-166545707-1
notes
Bibliogr.: 23 ref.
Open Access
Open Access (roheline)
scientific publication
teaduspublikatsioon
TalTech department
language
inglise
Scopus
Scopus
classifier
3.1
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Gürsoy, C.C., Kraak, D., Ahmed, F., Taouil, M., Jenihhin, M., Hamdioui, S. On BTI aging rejuvenation in memory address decoders // 2022 IEEE 23rd Latin American Test Symposium, LATS 2022. Piscataway, NJ : IEEE, 2022. Code 184360. https://doi.org/10.1109/LATS57337.2022.9936940