Evolutionary approach to the functional test generation for digital circuits
author
Skobtsov, Y.A.
Ivanov, D.E.
Skobtsov, V.Y.
Ubar, Raimund-Johannes
statement of authorship
Y.A.Skobtsov, D.E.Ivanov, V.Y.Skobtsov, R.Ubar
source
BEC 2004 : proceedings of the 9th Biennial Baltic Electronics Conference : October 3-6, 2004, Tallinn, Estonia
location of publication
Tallinn
publisher
Tallinn University of Technology
year of publication
2004
pages
p. 229-232 : ill
subject term
digitaalintegraallülitused
testimine
geneetilised algoritmid
ISBN
9985-59-462-2
notes
Bibliogr.: 5 ref
language
inglise