A novel random approach to diagnostic test generation
author
Osimiry, Emmanuel Ovie
Ubar, Raimund-Johannes
Kostin, Sergei
Raik, Jaan
statement of authorship
Emmanuel Ovie Osimiry, Raimund Ubar, Sergei Kostin, Jaan Raik
source
2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark
location of publication
Piscataway
publisher
IEEE
year of publication
2016
pages
[4] p. : ill
conference name, date
2nd IEEE NORCAS Conference, 1-2 November, 2016
conference location
Copenhagen, Denmark
url
https://doi.org/10.1109/NORCHIP.2016.7792915
subject term
arvutisüsteemid
digitaalintegraallülitused
rikked
diagnostika (tehnika)
keyword
digital circuits and systems
random diagnostic tests
test generation
diagnostic resolution
ISBN
978-1-5090-1095-0
notes
Bibliogr.: 14 ref
TTÜ department
arvutitehnika instituut
language
inglise