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1

book article

Aspect-oriented testing of a rehabilitation systemSarna, Külli; Vain, JüriVALID 2014 : the Sixth International Conference on Advances in System Testing and Validation Lifecycle : October 12-16, 2014, Nice, France2014 / p. 73-78 : ill

book article
2

book article

At-speed functional built-in self-test methodology for processors [Electronic resource]Ubar, Raimund-Johannes; Indus, Viljar; Kalmend, OliverProceedings of the IASTED International Conference on Engineering and Applied Science : December 27-29, 2012, Columbo, Sri Lanka2012 / p. 168-172 : ill [CD-ROM]

book article
3

book article

Exploiting aspects in model-based testingSarna, Külli; Vain, JüriFOAL'12 : proceedings of the eleventh workshop on Foundations of Aspect-Oriented Languages : March 26, 2012, Potsdam, German2012 / p. 45-47 : ill https://www.researchgate.net/publication/254007794_Exploiting_aspects_in_model-based_testing

book article
4

book article

High-level test data generation for software based self-test in microprocessorsOyeniran, Adeboye Stephen; Jasnetski, Artjom; Tšertov, Anton; Ubar, Raimund-Johannes2017 6th Mediterranean Conference on Embedded Computing (MECO) : including ECYPS'2017 : proceedings : research monograph : Bar, Montenegro, June 11th-15th, 20172017 / p. 86-91 : ill https://doi.org/10.1109/MECO.2017.7977167

book article
5

book article

High-level test generation for processing elements in many-core systemsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Azad, Siavoosh Payandeh; Raik, Jaan12th International Symposium on Reconfigurable Communication-centric Systems-on-Chip (ReCoSoC2017), July 12-14, 2017, Madrid, Spain : proceedings2017 / 8 p. : ill http://dx.doi.org/10.1109/ReCoSoC.2017.8016156

book article
6

book article

Implementation-independent functional test for transition delay faults in microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, Jaan2020 23rd Euromicro Conference on Digital System Design (DSD), 26-28 August 2020, Kranj, Slovenia2020 / p. 646-650 https://doi.org/10.1109/DSD51259.2020.00105

book article
7

book article

Implementation-independent functional test generation for RISC microprocessorsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC 2019 : 27th IFIP/IEEE International Conference on Very Large Scale Integration : [proceedings]2019 / p. 82-87 : ill https://doi.org/10.1109/VLSI-SoC.2019.8920323

book article
8

book article

Multiple control fault testing in digital systems with high-level decision diagramsUbar, Raimund-Johannes; Oyeniran, Adeboye Stephen2016 IEEE International Conference on Automation, Quality and Testing, Robotics (AQTR) : THETA 20th edition : 19th-21st May, Cluj-Napoca, Romania : proceedings2016 / [6] p. : ill http://dx.doi.org/10.1109/AQTR.2016.7501287

book article
9

book article

A novel random approach to diagnostic test generationOsimiry, Emmanuel Ovie; Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2nd IEEE NORCAS Conference : 1-2 November 2016, Copenhagen, Denmark2016 / [4] p. : ill https://doi.org/10.1109/NORCHIP.2016.7792915

book article
10

book article EST / book article ENG

On test generation for microprocessors for extended class of functional faultsOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Jenihhin, Maksim; Raik, JaanVLSI-SoC: New technology enabler : 27th IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2019 Cusco, Peru, October 6–9, 2019 : Revised and Extended Selected Papers2020 / p. 21-44 https://doi.org/10.1007/978-3-030-53273-4 Conference proceedings at Scopus Article at Scopus

book article EST / book article ENG
11

book article

Synthesis of multiple fault oriented test groups from single fault test sets [Electronic resource]Ubar, Raimund-Johannes; Kostin, Sergei; Raik, Jaan2013 8th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) : 26-28 March 2013, Abu Dhabi, UAE2013 / p. 36-41 : ill [CD-ROM]

book article
12

book article

Teaching advanced test issues in digital electronicsUbar, Raimund-Johannes; Orasson, Elmet; Raik, Jaan; Wuttke, Heinz-DietrichProceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic2005 / p. S2B-1 - S2B-6 : ill http://dx.doi.org/10.1109/ITHET.2005.1560318

book article
13

book article

Teaching digital system testOyeniran, Adeboye Stephen; Ubar, Raimund-Johannes; Kruus, MargusThe 27th EAEEIE Annual Conference : June 7-9, 2017, Grenoble2017 / [6] p

book article
14

book article

A tool set for teaching design-for-testability of digital circuitsKostin, Sergei; Orasson, Elmet; Ubar, Raimund-JohannesEWME 2016 : 11th European Workshop on Microelectronics Education : May 11-13, 2016, Southampton, UK2016 / [6] p. : ill https://doi.org/10.1109/EWME.2016.7496466

book article

Number of records 14, displaying 1 - 14

1. behaviour level test generation
2. functional test generation
3. highlevel test generation
4. implementation-independent test generation
5. offline test generation
6. provably correct test generation
7. test generation
8. test generation and fault diagnosis
9. adaptive test strategy generation
10. automated test pattern generation
11. automatic test case generation
12. automatic test pattern generation
13. automatic test program generation
14. high-level test data generation
15. test program generation
16. Activity-based demand generation
17. automatic code generation
18. Automatic generation control
19. automatic GUI model generation
20. building and urban form generation
21. business model generation
22. code generation
23. disaster alert generation
24. distributed electricity generation
25. distributed generation
26. Distributed Generation (DG)
27. distributed generation systems
28. distributed power generation
29. distrubuted power generation
30. droplet generation
31. droplet generation rate control
32. electric power generation
33. electricity generation
34. energy generation
35. extreme penetration level of non synchronous generation
36. feasible path generation
37. fifth generation computer
38. fourth generation district heating
39. frequent item generation
40. generation
41. generation and transmission expansion planning
42. Generation Costs
43. generation of electric energy
44. generation succession
45. heat generation
46. hydroelectric power generation
47. hydrogen generation
48. I–III generation
49. job generation
50. multisine generation
51. next generation 4D printing
52. next generation sequencing
53. Next-generation probiotics
54. next-generation sequencing
55. oil-shale power generation
56. pattern Generation
57. photovoltaic (PV) generation
58. photovoltaic generation dispatch
59. power generation
60. power generation dispatch
61. power generation economics
62. power generation planning
63. PV generation
64. PV power generation
65. Renewable energy generation
66. renewable generation
67. residual generation
68. Second generation bioethanol
69. second generation of tribology models
70. second generation sequencing
71. silver generation
72. solar power generation
73. space generation advisory council
74. template based sql generation
75. trajectory generation
76. waste generation
77. wave generation
78. white light generation
79. wind energy generation
80. wind generation
81. wind power generation
82. 16S rRNA gene amplicon next-generation sequencing
83. 4GDH (4th generation district heating)
84. 4th generation district heating
85. 5th generation district heating
86. accelerated shelf-life test
87. antigen test
88. ASTM G65 dry sand rubber wheel abrasion test
89. automated test environment
90. Auvergne test-bed
91. battery test
92. behavioral test
93. bending test
94. bit-error rate test
95. Board and System Test
96. board test
97. bounds test
98. built-in self-test
99. capillary condensation redistribution test
100. chi-square test
101. closed bottle test
102. cognitive screening test
103. compartment fire test
104. compartment test
105. cone penetration test (CPT)
106. COVID-19 antigen test
107. cutting test
108. cybersecurity test bed
109. DDR4 interconnect test
110. design and test
111. design-for-test
112. deterministic test sequences
113. diagnostic test
114. digital test
115. Digital test and testable design
116. double-pulse test
117. drawing test
118. dry droplet antimicrobial test
119. embedded test
120. fan pressurisation test
121. final test result prediction
122. four-point bending test
123. FPGA based test
124. FPGA-Assisted Test
125. FPGA-centric test
126. functional self-test
127. Granger causality test
128. hardness test
129. high-level synthesis for test
130. high-speed serial link test
131. IEEE 9 bus test system
132. in situ tensile test in SEM
133. industrial field test
134. in-situ tensile test in SEM
135. Johansen cointegration test
136. Kolmogorov-Smirnov test
137. load test
138. logic built-in self-test
139. Luria alternating series test
140. Mann–Kendall test
141. memory interconnect test
142. microprocessor test
143. Model test
144. multiplier test
145. orthogonal test
146. package test analysis
147. parallel design and test
148. performance test
149. piezocone penetration test (CPTu)
150. Point Load Test index
151. pressurisation test
152. processor-centric board test
153. progressive damage test
154. pseudo-exhaustive test
155. purity test
156. rtioco-based timed test sequences
157. seasonal Mann Kendall test
158. seismic piezocone penetration test
159. self-test
160. self-test architectures
161. sentence writing test
162. serial sevens test
163. ship towing test tank
164. similar material simulation test
165. small-scale fire test
166. small‐scale test
167. software based self-test
168. software-based self-test
169. software-based self-test (SBST)
170. soil phosphorus (P) test
171. standard test method
172. static load test
173. static-dynamic probing test (SDT)
174. stress test
175. system level test
176. teaching design and test of systems
177. tensile test
178. test
179. test and evaluation platform
180. test bench
181. test coverage
182. test driven development
183. test driven modelling
184. test embankment
185. test equipment
186. test groups
187. test model design
188. test optimization
189. test packets
190. test path synthesis
191. test patterns
192. test point insertion
193. test reference year
194. test replication
195. test scenario description language
196. test-bed
197. test-chips
198. test-house
199. test-pattern
200. test-suite reduction
201. Three-point bending test
202. unit root test
203. 1995 ECC benchmark test

1. European Test Symposium (ETS)
2. 16PF (test)

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