Sequential circuit test generation using decision diagram models
author
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Raimund Ubar
source
Design, Automation and Test in Europe : DATE : Conference and Exhibition 1999 : Munich, Germany, March 9-12, 1999 : proceedings
location of publication
Los Alamitos
publisher
IEEE Computer Society
year of publication
1999
pages
p. 736-740: ill
url
https://www.cs.york.ac.uk/rts/docs/SIGDA-Compendium-1994-2004/papers/1999/date99/pdffiles/11e_1.pdf
subject term
elektriahelad
testimine
otsustusdiagrammid
ISBN
0-7695-0078-1
notes
Bibl. 8 ref
language
inglise