Defect-oriented test generation and fault simulation in the environment of MOSCITO
author
statement of authorship
A.Schneider, K.-H.Diener, E.Gramatova, M.Fisherova, E.Ivask, R.Ubar, W.Pleskacz, W.Kuzmicz
location of publication
Tallinn
publisher
year of publication
pages
p. 303-306 : ill
ISBN
9985-59-292-1
notes
Bibliogr.: 12 ref
Schneider, A., Diener, K.-H., Gramatova, E., Fisherova, M., Ivask, E., Ubar, R.-J., Pleskacz, W., Kuzmicz, W. Defect-oriented test generation and fault simulation in the environment of MOSCITO // BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia. Tallinn : [Tallinn Technical University], 2002. p. 303-306 : ill.