Schneider, A., Diener, K.-H., Gramatova, E., Fisherova, M., Ivask, E., Ubar, R.-J., Pleskacz, W., Kuzmicz, W.

full record print

Defect-oriented test generation and fault simulation in the environment of MOSCITO

author

Schneider, Andre

Diener, Karl-Heinz

Gramatova, Elena

Fisherova, Maria

Ivask, Eero

Ubar, Raimund-Johannes

Pleskacz, Witold A.

Kuzmicz, W.

statement of authorship

A.Schneider, K.-H.Diener, E.Gramatova, M.Fisherova, E.Ivask, R.Ubar, W.Pleskacz, W.Kuzmicz

source

BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia

location of publication

Tallinn

publisher

[Tallinn Technical University]

year of publication

2002

pages

p. 303-306 : ill

ISBN

9985-59-292-1

notes

Bibliogr.: 12 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaaltehnika

defektid

rikked

testimine

simulatsioon

Schneider, A., Diener, K.-H., Gramatova, E., Fisherova, M., Ivask, E., Ubar, R.-J., Pleskacz, W., Kuzmicz, W. Defect-oriented test generation and fault simulation in the environment of MOSCITO // BEC 2002 : proceedings of the 8th Biennial Baltic Electronics Conference : October 6-9, 2002, Tallinn, Estonia. Tallinn : [Tallinn Technical University], 2002. p. 303-306 : ill.