Multi-fragment Markov model guided online test generation for MPSoC

author
Vain, Jüri
Tsiopoulos, Leonidas
Kharchenko, Vyacheslav
Apneet Kaur
Jenihhin, Maksim
Raik, Jaan
statement of authorship
Jüri Vain, Leonidas Tsiopoulos, Vyacheslav Kharchenko, Apneet Kaur, Maksim Jenihhin, and Jaan Raik
source
ICTERI 2017 : ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer : proceedings of the 13th International Conference on ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer, Kyiv, Ukraine, May 15-18, 2017
location of publication
Aachen
publisher
CEUR-WS.org
year of publication
2017
pages
p. 594-607 : ill
series
CEUR workshop proceedings ; 1844
conference name, date
13th International Conference on ICT in Education, Research and Industrial Applications. Integration, Harmonization and Knowledge Transfer, ICTERI 2017, May 15-18, 2017
conference location
Kyiv, Ukraine
url
http://www.scopus.com/inward/record.uri?eid=2-s2.0-85020540459&partnerID=40&md5=af226e25c344c52689f23bf5c39cc267
http://ceur-ws.org/Vol-1844/10000594.pdf
subject term
kuupvõrgud
tarkvaraarendus
testimine
modelleerimine (teadus)
keyword
formal methods
Markov models
model-based testing
multi-processor system-on-chip
UPPAAL timed automata
verification
ISSN
1613-0073
notes
Bibliogr.: 19 ref
TTÜ department
tarkvarateaduse instituut
arvutisüsteemide instituut
language
inglise