Evolutionary approach to test generation for functional BIST
author
Skobtsov, Y.A.
Ivanov, D.E.
Skobtsov, V.Y.
Ubar, Raimund-Johannes
Raik, Jaan
statement of authorship
Y.A.Skobtsov, D.E.Ivanov, V.Y.Skobtsov, R.Ubar, J.Raik
source
Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005
location of publication
[Tallinn
publisher
Tallinn University of Technology]
year of publication
2005
pages
p. 151-155 : ill
url
https://artiklid.elnet.ee/record=b1018764*est
subject term
elektronlülitused
teimimine
raalteimimine
notes
Bibliogr.: 11 ref
language
inglise