Informal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 2005 (source)

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  • book article
    Efficient at-speed interconnect BIST and diagnosis frameworkJutman, ArturInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 257-258 : ill
    book article
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    Evolutionary approach to test generation for functional BISTSkobtsov, Y.A.; Ivanov, D.E.; Skobtsov, V.Y.; Ubar, Raimund-Johannes; Raik, JaanInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. 151-155 : ill https://artiklid.elnet.ee/record=b1018764*est
    book article
  • book article
    ForewordUbar, Raimund-Johannes; Prinetto, Paolo; Al-Hashimi, BashirInformal Digest of Papers : 10 IEEE European Test Symposium : Tallinn, Estonia, May 22-25, 20052005 / p. III
    book article
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