Ivask, E., Raik, J., Ubar, R. - TalTech Research Portal

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Comparison of genetic and random techniques for test pattern generation

author

Ivask, Eero

Raik, Jaan

Ubar, Raimund-Johannes

statement of authorship

E.Ivask, J.Raik, R.Ubar

source

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1998

pages

p. 163-166: ill

ISBN

9985-59-081-3

notes

Bibl. 8 ref

Ivask, E., Raik, J., Ubar, R. Comparison of genetic and random techniques for test pattern generation // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 163-166: ill.