Ivask, E., Raik, J., Ubar, R. - TalTech teadusportaal

täiskirje prindi

Comparison of genetic and random techniques for test pattern generation

autor

Ivask, Eero

Raik, Jaan

Ubar, Raimund-Johannes

vastutusandmed

E.Ivask, J.Raik, R.Ubar

allikas

BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings

ilmumiskoht

[Tallinn]

ilmumisaasta

1998

leheküljed

p. 163-166: ill

ISBN

9985-59-081-3

märkused

Bibl. 8 ref

Ivask, E., Raik, J., Ubar, R. Comparison of genetic and random techniques for test pattern generation // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 163-166: ill.