prindi

Comparison of genetic and random techniques for test pattern generation

autor
Ivask, Eero
Raik, Jaan
Ubar, Raimund-Johannes
vastutusandmed
E.Ivask, J.Raik, R.Ubar
allikas
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
ilmumiskoht
[Tallinn]
ilmumisaasta
1998
leheküljed
p. 163-166: ill
ISBN
9985-59-081-3
märkused
Bibl. 8 ref
Ivask, E., Raik, J., Ubar, R. Comparison of genetic and random techniques for test pattern generation // BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings. [Tallinn], 1998. p. 163-166: ill.