Calculation of testability measures on structurally synthesized binary decision diagrams
author
Ubar, Raimund-Johannes
Heinlaid, J.
Raik, Jaan
Raun, L.
statement of authorship
R.Ubar, J.Heinlaid, J.Raik, L.Raun
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 179-182: ill
ISBN
9985-59-081-3
notes
Bibl. 13 ref