Constraint-based hierarchical untestability identification for synchronous sequential circuits
author
statement of authorship
Jaan Raik, Anna Rannaste, Maksim Jenihhin, Taavi Viilukas, Raimund Ubar, Hideo Fujiwara
source
Sixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim
location of publication
[S.l.]
publisher
year of publication
pages
p. 147-152
conference name, date
Sixteenth IEEE European Test Symposium : 23-27 May 2011
conference location
Trondheim
subject term
ISSN
1530-1877
ISBN
978-0-7695-4433-5
978-1-4577-0483-3
notes
Bibliogr.: 19 ref
language
inglise
Raik, J., Rannaste, A., Jenihhin, M., Viilukas, T., Ubar, R., Fujiwara, H. Constraint-based hierarchical untestability identification for synchronous sequential circuits // Sixteenth IEEE European Test Symposium : 23-27 May 2011, Trondheim. [S.l.] : IEEE, 2011. p. 147-152.