Teaching advanced test issues in digital electronics
author
Ubar, Raimund-Johannes
Orasson, Elmet
Raik, Jaan
Wuttke, Heinz-Dietrich
statement of authorship
Raimund Ubar, Elmet Orasson, Jaan Raik, Heinz-Dietrich Wuttke
source
Proceedings of the 6th IEEE International Conference on Information Technology Based Higher Education and Training : ITHET : July 7-9, 2005, Juan Dolio, Dominican Republic
location of publication
[S.l.]
publisher
IEEE
year of publication
2005
pages
p. S2B-1 - S2B-6 : ill
conference name, date
6th IEEE International Conference on Information Technology Based Higher Education and Training, July 7-9, 2005
conference location
Juan Dolio, Dominican Republic
url
http://dx.doi.org/10.1109/ITHET.2005.1560318
subject term
digitaaltehnika
integraallülitused
testimine
e-õpe
audiovisuaalne õpe
keyword
e-learning
digital electronics
living pictures
physical defects
test generation
ISBN
0-7803-9141-1
notes
Biobliogr.: 11 ref
TTÜ department
arvutitehnika instituut
language
inglise