DECIDER : a system for hierarchical test pattern generation
author
Raik, Jaan
Ubar, Raimund-Johannes
statement of authorship
Jaan Raik, Raimund Ubar
source
Radioelectronics and informatics
journal volume number month
3
year of publication
2003
pages
p. 40-45 : ill
url
https://www.researchgate.net/publication/250395975_DECIDER_A_System_for_Hierarchical_Test_Pattern_Generation
subject term
otsustusdiagrammid
mudelid
testimine
ISSN
1563-0064
notes
Bibliogr.: 16 ref
Special issue: Proceedings of East-West Design & Test Conference (EWDTC’03): Yalta, Alushta, Crimea, Ukraine, September 17-21, 2003
language
inglise