Robson, M., Russel, G. - TalTech Research Portal

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A BIST scheme for testing mixed analogue and digital circuits

author

Robson, Malcolm

Russel, Gordon

statement of authorship

M.Robson, G.Russel

source

BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings

location of publication

[Tallinn]

year of publication

1996

pages

p. 183-186: ill

ISBN

9985-59-026-0

notes

Bibl. 5 ref

language

inglise

Märksõnad ja võtmesõnad

subject term

digitaalelektroonika

analoogelektroonika

testimine

Robson, M., Russel, G. A BIST scheme for testing mixed analogue and digital circuits // BEC'96 : the 5th Biennial Baltic Electronics Conference, October 7-11, 1996, Tallinn, Estonia : proceedings. [Tallinn], 1996. p. 183-186: ill.