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Representing gate-level SET faults by multiple SEU faults on RT-level

author
statement of authorship
Ahmet Cagri Bagbaba, Maksim Jenihhin, Raimund Ubar, Christian Sauer
source
2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings
location of publication
Danvers
publisher
year of publication
pages
art. 19889351, 6 p. : ill
conference name, date
IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020
conference location
Napoli, Italy
url
ISBN
9781728181875
notes
Bibliogr.: 20 ref
scientific publication
teaduspublikatsioon
TTÜ department
language
inglise
Reserch Group
Centre for trustworthy and efficient computing hardware (TECH)
Centre of dependable computing systems
Bagbaba, A.C., Jenihhin, M., Ubar, R., Sauer, C. Representing gate-level SET faults by multiple SEU faults on RT-level // 2020 IEEE 26th International Symposium on On-Line Testing and Robust System Design (IOLTS), 13-15 July 2020 : proceedings. Danvers : IEEE, 2020. art. 19889351, 6 p. : ill. https://doi.org/10.1109/IOLTS50870.2020.9159715