An improved test generation approach for sequential circuits using decision diagrams
author
Brik, Marina
Ubar, Raimund-Johannes
statement of authorship
Marina Brik, Raimund Ubar
source
BEC'98 : the 6th Biennial Conference on Electronics and Microsystems Technology, October 7-9, 1998, Tallinn, Estonia : proceedings
location of publication
[Tallinn]
year of publication
1998
pages
p. 155-158: ill
ISBN
9985-59-081-3
notes
Bibl. 8 ref