Sequential test set compaction in LFSR reseeding
author
Jutman, Artur
Aleksejev, Igor
Raik, Jaan
statement of authorship
Artur Jutman, Igor Aleksejev, Jaan Raik
source
Design and test technology for dependable systems-on-chip
location of publication
Hershey
publisher
Information Science Reference
year of publication
2011
pages
p. 476-493 : ill
url
https://ieeexplore.ieee.org/document/4738292
subject term
järjendanalüüs
testimine
elektrisüsteemid
rikked
riistvara
registrid
tagasisidega juhtimissüsteemid
ISBN
978-1-60960-212-3
notes
Bibliogr. p. 491-493
language
inglise