Computer-aided examination of the I²L current source and the behaviour of the I²L flip-flop used in static memory cells
author
statement of authorship
T. Rang
publisher
journal volume number month
vol. 25, no. 2
year of publication
pages
p. 159-165 : joon
ISSN
0324-6000
notes
Bibliogr.: 6 nim.
language
inglise
TTÜ department
Rang, T. Computer-aided examination of the I²L current source and the behaviour of the I²L flip-flop used in static memory cells // Periodica polytechnica. Electrical engineering = Электротехника (1981) vol. 25, no. 2, p. 159-165 : joon. https://www.ester.ee/record=b1198855*est https://pp.bme.hu/ee/article/view/4776/3881