Test generation for control faults in digital systems
author
statement of authorship
J.Dushina, M.Brik
location of publication
Tallinn
year of publication
pages
p. 325-330: ill
subject term
ISBN
9985-59-012-0
notes
Bibl. 16 ref
language
inglise
Dushina, J., Brik, M. Test generation for control faults in digital systems // BEC : Baltic Electronics Conference : proceedings of the 4th Biennial Conference, October 9-14, 1994, Tallinn (Estonia). 1. Tallinn, 1994. p. 325-330: ill.