Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
author
statement of authorship
D. Kropman, T. Kärner, S. Dolgov, I. Heinmaa, T. Laas, C. A. Londos
source
The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest
location of publication
Riga
publisher
year of publication
pages
p. 231-233
conference name, date
The 9th International Conference on Global Research and Education, August 9-12, 2010
conference location
Riga
subject term
ISBN
978-9934-10-046-8
language
inglise
Kropman, D., Kärner, T., Dolgov, S., Heinmaa, I., Laas, T., Londos, C. A. Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties // The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest. Riga : RTU Publishing House, 2010. p. 231-233.