Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties
autor
vastutusandmed
D. Kropman, T. Kärner, S. Dolgov, I. Heinmaa, T. Laas, C. A. Londos
allikas
The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest
ilmumiskoht
Riga
kirjastus/väljaandja
ilmumisaasta
leheküljed
p. 231-233
konverentsi nimetus, aeg
The 9th International Conference on Global Research and Education, August 9-12, 2010
konverentsi toimumispaik
Riga
ISBN
978-9934-10-046-8
keel
inglise
Kropman, D., Kärner, T., Dolgov, S., Heinmaa, I., Laas, T., Londos, C. A. Interaction of point defects with impurities in the Si-SiO2 system and its influence on the interface properties // The 9th International Conference on Global Research and Education : August 9-12, 2010, Riga : digest. Riga : RTU Publishing House, 2010. p. 231-233.