Mutation analysis with high-level decision diagrams
author
Hantson, Hanno
Raik, Jaan
Jenihhin, Maksim
Tšepurov, Anton
Ubar, Raimund-Johannes
Guglielmo, Giuseppe di
Fummi, Franco
statement of authorship
Hanno Hantson, Jaan Raik, Maksim Jenihhin, Anton Chepurov, Raimund Ubar, Giuseppe di Guglielmo, Franco Fummi
source
LATW2010 : 11th Latin-American TestWorkshop, March 28-31, 2010, Punta del Este, Uruguay
location of publication
[S.l.]
publisher
IEEE
year of publication
2010
pages
[6] p. [CD-ROM]
conference name, date
11th Latin-American TestWorkshop, 28-31.03.2010
conference location
Punta del Este, Uruguay
ISBN
978-1-4244-7786-9
language
inglise