Fast extended test access via JTAG and FPGAs
author
Devadze, Sergei
Jutman, Artur
Aleksejev, Igor
Ubar, Raimund-Johannes
statement of authorship
Sergei Devadze, Artur Jutman, Igor Aleksejev, Raimund Ubar
source
International Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings
location of publication
Washington
publisher
International Test Conference
year of publication
2009
pages
p. 1-7 : ill
conference name, date
40th International Test Conference ITC'2009, November 1-6, 2009
conference location
Austin, Texas
url
http://dx.doi.org/10.1109/TEST.2009.5355668
subject term
elektroonikaaparatuur
rikked
testimine
ISSN
1089-3539
ISBN
978-1-4244-4867-8
notes
Bibliogr.: 13 ref
TTÜ department
arvutitehnika instituut
language
inglise