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Fast extended test access via JTAG and FPGAsDevadze, Sergei; Jutman, Artur; Aleksejev, Igor; Ubar, Raimund-JohannesInternational Test Conference 2009 : November 1 - November 6, 2009, Austin Convention Center, Austin, Texas USA : proceedings2009 / p. 1-7 : ill http://dx.doi.org/10.1109/TEST.2009.5355668

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FPGA-based synthetic instrumentation for board testAleksejev, Igor; Jutman, Artur; Devadze, Sergei; Odintsov, Sergei; Wenzel, ThomasProceedings : International Test Conference 20122012 / p. 1-10 : ill

book article

Number of records 2, displaying 1 - 2

1. 24th IEEE International Conference on Industrial Technology 2023
2. international relations and international political economy
3. accelerated shelf-life test
4. adaptive test strategy generation
5. antigen test
6. ASTM G65 dry sand rubber wheel abrasion test
7. automated test environment
8. automated test pattern generation
9. automatic test case generation
10. automatic test pattern generation
11. automatic test program generation
12. Auvergne test-bed
13. battery test
14. behavioral test
15. behaviour level test generation
16. bending test
17. bit-error rate test
18. Board and System Test
19. board test
20. bounds test
21. built-in self-test
22. capillary condensation redistribution test
23. chi-square test
24. closed bottle test
25. cognitive screening test
26. compartment fire test
27. compartment test
28. cone penetration test (CPT)
29. COVID-19 antigen test
30. cutting test
31. cybersecurity test bed
32. DDR4 interconnect test
33. design and test
34. design-for-test
35. deterministic test sequences
36. diagnostic test
37. digital test
38. Digital test and testable design
39. double-pulse test
40. drawing test
41. dry droplet antimicrobial test
42. embedded test
43. fan pressurisation test
44. final test result prediction
45. four-point bending test
46. FPGA based test
47. FPGA-Assisted Test
48. FPGA-centric test
49. functional self-test
50. functional test generation
51. Granger causality test
52. hardness test
53. high-level synthesis for test
54. high-level test data generation
55. highlevel test generation
56. high-speed serial link test
57. IEEE 9 bus test system
58. implementation-independent test generation
59. in situ tensile test in SEM
60. industrial field test
61. in-situ tensile test in SEM
62. Johansen cointegration test
63. Kolmogorov-Smirnov test
64. load test
65. logic built-in self-test
66. Luria alternating series test
67. Mann–Kendall test
68. memory interconnect test
69. microprocessor test
70. Model test
71. multiplier test
72. offline test generation
73. orthogonal test
74. package test analysis
75. parallel design and test
76. performance test
77. piezocone penetration test (CPTu)
78. Point Load Test index
79. pressurisation test
80. processor-centric board test
81. progressive damage test
82. provably correct test generation
83. pseudo-exhaustive test
84. purity test
85. rtioco-based timed test sequences
86. seasonal Mann Kendall test
87. seismic piezocone penetration test
88. self-test
89. self-test architectures
90. sentence writing test
91. serial sevens test
92. ship towing test tank
93. similar material simulation test
94. small-scale fire test
95. small‐scale test
96. software based self-test
97. software-based self-test
98. software-based self-test (SBST)
99. soil phosphorus (P) test
100. standard test method
101. static load test
102. static-dynamic probing test (SDT)
103. stress test
104. system level test
105. teaching design and test of systems
106. tensile test
107. test
108. test and evaluation platform
109. test bench
110. test coverage
111. test driven development
112. test driven modelling
113. test embankment
114. test equipment
115. test generation
116. test generation and fault diagnosis
117. test groups
118. test model design
119. test optimization
120. test packets
121. test path synthesis
122. test patterns
123. test point insertion
124. test program generation
125. test reference year
126. test replication
127. test scenario description language
128. test-bed
129. test-chips
130. test-house
131. test-pattern
132. test-suite reduction
133. Three-point bending test
134. unit root test
135. 1995 ECC benchmark test

1. International Baltic conference on engineering materials and tribology (24 : 2015 : Tallinn)
2. European Test Symposium (ETS)
3. 16PF (test)
4. Danube Adria Association for Automation and Manufacturing. International conference

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