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Multiple-objective backtrace for solving test generation constraints

author
Mekler, A.
Raik, Jaan
statement of authorship
A.Mekler, J.Raik
source
International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings
location of publication
Tampere
year of publication
pages
p. 123-126 : ill
url
ISBN
0-7803-8160-2
notes
Bibliogr.: 9 ref
language
inglise
Mekler, A., Raik, J. Multiple-objective backtrace for solving test generation constraints // International Symposium on System-on-Chip : November 19-21, 2003, Tampere, Finland : proceedings. Tampere, 2003. p. 123-126 : ill. https://ieeexplore.ieee.org/document/1267732