Dependence of multifractal analysis parameters on the darkness of a processed image

statement of authorship
Merike Martsepp, Tõnu Laas, Katrin Laas, Jaanis Priimets, Siim Tõkke, Valdek Mikli
publisher
journal volume number month
vol. 156
year of publication
pages
art. 111811
keyword
SEM
optical microscope
image darkness
ISSN
0960-0779
scientific publication
teaduspublikatsioon
classifier
1.1
kvartiil
Q1
language
eesti
Martsepp, M., Laas, T., Laas, K., Priimets, J., Tõkke, S., Mikli, V. Dependence of multifractal analysis parameters on the darkness of a processed image // Chaos, Solitons & Fractals (2022) vol. 156, art. 111811. https://doi.org/10.1016/j.chaos.2022.111811