Representing transparency conditions in test generation for VLSI by decision diagrams
author
statement of authorship
R. Ubar
location of publication
[S.l.]
year of publication
pages
p. 213-216
subject term
language
inglise
Ubar, R. Representing transparency conditions in test generation for VLSI by decision diagrams // Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997. [S.l.], 1997. p. 213-216.