prindi

Representing transparency conditions in test generation for VLSI by decision diagrams

autor
Ubar, Raimund-Johannes
vastutusandmed
R. Ubar
allikas
Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997
ilmumiskoht
[S.l.]
ilmumisaasta
1997
leheküljed
p. 213-216
märksõna
VLSI-ahelad
keel
inglise
Ubar, R. Representing transparency conditions in test generation for VLSI by decision diagrams // Proceedings of the First Electronic Circuits and Systems Conference : Bratislava, Slovakia, September 4-5, 1997. [S.l.], 1997. p. 213-216.