Analysis of a test method for delay faults in NoC interconnects
author
Bengtsson, Tomas
Jutman, Artur
Kumar, Shashi
Ubar, Raimund-Johannes
Peng, Zebo
statement of authorship
Tomas Bengtsson, Artur Jutman, Shashi Kumar, Raimund Ubar, Zebo Peng
source
Proceedings of the IEEE East-West Design & Test Workshop (EWDTW'06) : Sochi, Russia, September 15-19, 2006
location of publication
Kharkov
publisher
Kharkov National University of Radioelectronics
year of publication
2006
pages
p. 42-46 : ill
subject term
integraallülitused
testimine
ISBN
966-659-124-3
notes
Bibliogr.: 17 ref
language
inglise